Browsing by Author "Dworak, Jennifer Lynn"
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Dworak, Jennifer Lynn (Texas A&M University, 2004-09-30)Manufacture testing of digital integrated circuits is essential for high quality. However, exhaustive testing is impractical, and only a small subset of all possible test patterns (or test pattern pairs) may be applied. ...
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Dworak, Jennifer Lynn (Texas A&M University, 2000)The primary purpose of digital circuit manufacture testing is to detect defective parts so that they will not be sold to customers. Predicting the defective part level, which results after a set of test patterns has been ...